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Proceedings Paper

A regularization algorithm for registration of deformable surfaces
Author(s): Sergei Voronin; Artyom Makovetskii; Aleksei Voronin; J. Diaz-Escobar
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Paper Abstract

The registration of two surfaces is finding a geometrical transformation of a template surface to a target surface. The transformation combines the positions of the semantically corresponding points. The transformation can be considered as warping the template onto the target. To choose the most suitable transformation from all possible warps, a registration algorithm must satisfies some constraints on the deformation. This is called regularization of the deformation field. Often use regularization based on minimizing the difference between transformations for different vertices of a surface. The variational functional consists of the several terms. One of them is the functional of the ICP (Iterative Closest Point algorithm) variational subproblem for the point-to-point metric for affine transformations. Other elements of the functional are stiffness and landmark terms. In proposed presentation we use variational functional based on the point-toplane metric for affine transformations. In addition, the use of orthogonal transformations is considered. The proposed algorithm is robust relative to bad initialization and incomplete surfaces. For noiseless and complete data, the registration is one-to-one. With the help of computer simulation, the proposed method is compared with known algorithms for the searching of optimal geometrical transformation.

Paper Details

Date Published: 17 September 2018
PDF: 10 pages
Proc. SPIE 10752, Applications of Digital Image Processing XLI, 107522S (17 September 2018); doi: 10.1117/12.2321521
Show Author Affiliations
Sergei Voronin, Chelyabinsk State Univ. (Russian Federation)
Artyom Makovetskii, Chelyabinsk State Univ. (Russian Federation)
Aleksei Voronin, Chelyabinsk State Univ. (Russian Federation)
J. Diaz-Escobar, CICESE (Mexico)

Published in SPIE Proceedings Vol. 10752:
Applications of Digital Image Processing XLI
Andrew G. Tescher, Editor(s)

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