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Proceedings Paper

Tilted wave interferometry for testing large surfaces
Author(s): Antonia Harsch; Christof Pruss; Alexander Haberl; Wolfgang Osten
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Paper Abstract

Measuring large surfaces interferometrically is a straight forward established technology, as long as they are concave and spherical. The situation chnages completely if aspheres and freeforms have to be measured. The application of a Tilted Wave Interferometer opens up possibilities to measure large concave surfaces of any shape without compensation optics. For the investigation of large convex aspheres, it is necessary to make use of stitching methods. Due to the freeform capability of the Tilted Wave Interefrometer, it is possible to acquire larger subapertures compared to null interferometers. Therefore measurement and computation time are reduced.

Paper Details

Date Published: 7 August 2018
PDF: 6 pages
Proc. SPIE 10829, Fifth European Seminar on Precision Optics Manufacturing, 1082908 (7 August 2018); doi: 10.1117/12.2318573
Show Author Affiliations
Antonia Harsch, Univ. Stuttgart (Germany)
Christof Pruss, Univ. Stuttgart (Germany)
Alexander Haberl, Deggendorf Institute of Technology (Germany)
Wolfgang Osten, Univ. Stuttgart (Germany)

Published in SPIE Proceedings Vol. 10829:
Fifth European Seminar on Precision Optics Manufacturing
Rolf Rascher; Christian Schopf, Editor(s)

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