
Proceedings Paper
Luminescence of Ho-doped lithium niobate crystals highlighted by Raman spectroscopyFormat | Member Price | Non-Member Price |
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Paper Abstract
Raman measurements were carried out on Ho3+ doped Lithium Niobate crystals. When the excitation wavelength of 532nm is used, in addition of expected Raman modes, forbidden bands are detected, while when exciting with 785nm, “classical” Raman spectrum was recorded with expected modes according to Raman selection rules. Additional lines are attributed to emission lines of Ho doped crystals. We detect, within a very good resolution, in the same Stokes spectrum, the transitions between the electronic states, and the vibrational states as well. We report on the analysis of these data as function of Ho-content, for different polarizations and wavelengths, of the incident laser beam.
Paper Details
Date Published: 4 September 2018
PDF: 4 pages
Proc. SPIE 10750, Reflection, Scattering, and Diffraction from Surfaces VI, 107500K (4 September 2018); doi: 10.1117/12.2318550
Published in SPIE Proceedings Vol. 10750:
Reflection, Scattering, and Diffraction from Surfaces VI
Leonard M. Hanssen, Editor(s)
PDF: 4 pages
Proc. SPIE 10750, Reflection, Scattering, and Diffraction from Surfaces VI, 107500K (4 September 2018); doi: 10.1117/12.2318550
Show Author Affiliations
N. Kokanyan, Lab. Matériaux Optiques, Photonique et Systèmes, CentraleSupélec, Univ. Paris- Saclay (France)
Univ. de Lorraine, Lab. Matériaux Optiques, Photonique et Systèmes (France)
E. Kokanyan, Institute for Physical Researches (Armenia)
Armenian State Pedagogical Univ. (Armenia)
N. Babajanyan, Armenian State Pedagogical Univ. (Armenia)
Univ. de Lorraine, Lab. Matériaux Optiques, Photonique et Systèmes (France)
E. Kokanyan, Institute for Physical Researches (Armenia)
Armenian State Pedagogical Univ. (Armenia)
N. Babajanyan, Armenian State Pedagogical Univ. (Armenia)
T. Kauffmann, Lab. Matériaux Optiques, Photonique et Systèmes, CentraleSupélec, Univ. Paris- Saclay, (France)
Univ. de Lorraine, Lab. Matériaux Optiques, Photonique et Systèmes (France)
M. D. Fontana, Lab. Matériaux Optiques, Photonique et Systèmes, CentraleSupélec, Univ. Paris- Saclay (France)
Univ. de Lorraine, Lab. Matériaux Optiques, Photonique et Systèmes (France)
Univ. de Lorraine, Lab. Matériaux Optiques, Photonique et Systèmes (France)
M. D. Fontana, Lab. Matériaux Optiques, Photonique et Systèmes, CentraleSupélec, Univ. Paris- Saclay (France)
Univ. de Lorraine, Lab. Matériaux Optiques, Photonique et Systèmes (France)
Published in SPIE Proceedings Vol. 10750:
Reflection, Scattering, and Diffraction from Surfaces VI
Leonard M. Hanssen, Editor(s)
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