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Proceedings Paper

Design and analysis of aspherical multilayer imaging x-ray microscope
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Paper Abstract

Considerable effort has been devoted recently to the design, analysis, fabrication, and testing of spherical Schwarzschild microscopes for soft x-ray applications in microscopy and projection lithography. The spherical Schwarzschild microscope consist of two concentric spherical mirrors configured such that third order spherical aberration and coma are zero. Since multilayers are used on the mirror substrates for x-ray applications, it is desirable to have only two reflecting surfaces in a microscope. In order to reduce microscope aberrations and increase the field of view, generalized mirror surface profiles have been considered in this study. Based on incoherent, sine wave modulation transfer function (MTF) calculations, the object plane resolution of a microscope has been analyzed as a function of the object height and numerical aperture (NA) of the primary for several spherical Schwarzschild, conic, and aspherical reflecting two-mirror microscope configurations. The ultimate resolution of an aspherical two-mirror microscope appears to be about 200 A when using 100 A radiation. Better resolution can be produced when shorter wavelength radiation is used.

Paper Details

Date Published: 1 February 1991
PDF: 11 pages
Proc. SPIE 1343, X-Ray/EUV Optics for Astronomy, Microscopy, Polarimetry, and Projection Lithography, (1 February 1991); doi: 10.1117/12.23185
Show Author Affiliations
David L. Shealy, Univ. of Alabama/Birmingham (United States)
Wu Jiang, Univ. of Alabama/Birmingham (United States)
Richard B. Hoover, NASA/Marshall Space Flight Ctr. (United States)

Published in SPIE Proceedings Vol. 1343:
X-Ray/EUV Optics for Astronomy, Microscopy, Polarimetry, and Projection Lithography

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