Proceedings Paper
Diffraction ring pattern and z-scan measurement of amorphous As2S3 thin film| Format | Member Price | Non-Member Price |
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Paper Abstract
The complex nonlinear refractive index has been measured and analyzed by adapting the sensitive cw z-scan technique in an amorphous As2S3 thin film. Diffraction rings which is caused by spatial self phase modulation are also observed.
Paper Details
Date Published: 1 September 1996
PDF: 2 pages
Proc. SPIE 2778, 17th Congress of the International Commission for Optics: Optics for Science and New Technology, 2778AS (1 September 1996); doi: 10.1117/12.2316077
Published in SPIE Proceedings Vol. 2778:
17th Congress of the International Commission for Optics: Optics for Science and New Technology
Joon-Sung Chang; Jai-Hyung Lee; ChangHee Nam, Editor(s)
PDF: 2 pages
Proc. SPIE 2778, 17th Congress of the International Commission for Optics: Optics for Science and New Technology, 2778AS (1 September 1996); doi: 10.1117/12.2316077
Show Author Affiliations
Yeung Joon Sohn, Yeungnam Univ. (Korea, Republic of)
Published in SPIE Proceedings Vol. 2778:
17th Congress of the International Commission for Optics: Optics for Science and New Technology
Joon-Sung Chang; Jai-Hyung Lee; ChangHee Nam, Editor(s)
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