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Proceedings Paper

Analysis of MTF based on MCP-CMOS
Author(s): Kai Qiao; Chuan Jin; Gangcheng Jiao; Hongchang Cheng; Shengkai Wang; Zhuang Miao
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Paper Abstract

Low Level Light (LLL) night vision technology is extensively applied in national defense and civil application fields. The digitization of LLL imaging is trend of light detection technology in the future. The corresponding modulation transfer function (MTF) and total system MTF model were established, base on the structure composition and operation principle. Simulation was carried out to analyze the performance of the MTF modern. Results indicate that the MCPCMOS better contrast of object. When the spatial frequency increasing, the MTF of MCP-CMOS downing faster than that of GaAs LLL image intensifier. The GaAs image intensifier shows an better image restoration capability and higher limiting resolution. The model and simulation results can provide a theoretical guidance for the fabrication and application of high imaging quality MCP-CMOS.

Paper Details

Date Published: 20 February 2018
PDF: 6 pages
Proc. SPIE 10697, Fourth Seminar on Novel Optoelectronic Detection Technology and Application, 106972K (20 February 2018); doi: 10.1117/12.2315586
Show Author Affiliations
Kai Qiao, Science and Technology on Low-Light-Level Night Vision Lab. (China)
Kunming Institute of Physics (China)
Chuan Jin, Science and Technology on Low-Light-Level Night Vision Lab. (China)
Kunming Institute of Physics (China)
Gangcheng Jiao, Science and Technology on Low-Light-Level Night Vision Lab. (China)
Kunming Institute of Physics (China)
Hongchang Cheng, Science and Technology on Low-Light-Level Night Vision Lab. (China)
Kunming Institute of Physics (China)
Shengkai Wang, Science and Technology on Low-Light-Level Night Vision Lab. (China)
Kunming Institute of Physics (China)
Zhuang Miao, Science and Technology on Low-Light-Level Night Vision Lab. (China)
Kunming Institute of Physics (China)


Published in SPIE Proceedings Vol. 10697:
Fourth Seminar on Novel Optoelectronic Detection Technology and Application
Weiqi Jin; Ye Li, Editor(s)

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