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Proceedings Paper

Characterizing and reducing the POL-2 instrumental polarization
Author(s): Per Friberg; David Berry; Giorgio Savini; Dan Bintley; Jessica Dempsey; Sarah Graves; Harriet Parsons
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Paper Abstract

Sub-millimeter polarization observations using the POL-2 instrument mounted on the dual wavelength (850/450 μm) 10 k pixel sub-millimeter camera SCUBA-2 is in high demand on the James Clerk Maxwell Telescope (JCMT). The high level of Instrumental Polarization (IP) generated by the Gore-TexTM wind blind protecting the telescope is a hampering factor for these observations. The wind blind both introduces an overall linear polarization and a four lobed polarization footprint seen on strong point sources after removal of a beam averaged IP. During commissioning an IP model was developed for the 850 μm band but a good 450 μm model was lacking. This paper describes the effort to improve the 850 μm IP model, establish a 450 μm model and the work to understand and model the IP. During the work the wind blind was removed for a month to isolate the contribution of the wind blind from other sources of the IP. A theoretical model for the non wind blind generated IP has been developed. However, a theoretical model for the wind blind IP is still being worked on.

Paper Details

Date Published: 9 July 2018
PDF: 9 pages
Proc. SPIE 10708, Millimeter, Submillimeter, and Far-Infrared Detectors and Instrumentation for Astronomy IX, 107083M (9 July 2018); doi: 10.1117/12.2314345
Show Author Affiliations
Per Friberg, East Asian Observatory (United States)
David Berry, East Asian Observatory (United States)
Giorgio Savini, Univ. College London (United Kingdom)
Dan Bintley, East Asian Observatory (United States)
Jessica Dempsey, East Asian Observatory (United States)
Sarah Graves, East Asian Observatory (United States)
Harriet Parsons, East Asian Observatory (United States)

Published in SPIE Proceedings Vol. 10708:
Millimeter, Submillimeter, and Far-Infrared Detectors and Instrumentation for Astronomy IX
Jonas Zmuidzinas; Jian-Rong Gao, Editor(s)

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