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Proceedings Paper

Development of TiAu TES x-ray calorimeters for the X-IFU on ATHENA space observatory
Author(s): P. Khosropanah; E. Taralli; L. Gottardi; C. P. de Vries; K. Nagayoshi; M. L. Ridder; H. Akamatsu; M. P. Bruijn; J.-R. Gao
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Paper Abstract

SRON is developing X-ray transition edge sensor (TES) calorimeters arrays, as a backup technology for X-IFU instrument on the ATHENA space observatory. These detectors are based on a superconducting TiAu bilayer TES with critical temperature of 100 mK on a 1 μm thick SiN membrane with Au or Au/Bi absorbers. Number of devices have been fabricated and measured using a Frequency Division Multiplexing (FDM) readout system with 1-5 MHz bias frequencies. We measured IV curves, critical temperature, thermal conductance, noise and also X-ray energy resolution at number of selected bias points. So far our best calorimeter shows 3.9 eV X-ray resolution at 6 keV. Here we present a summary of our results and the latest status of development of X-ray calorimeters at SRON.

Paper Details

Date Published: 6 July 2018
PDF: 11 pages
Proc. SPIE 10699, Space Telescopes and Instrumentation 2018: Ultraviolet to Gamma Ray, 106991M (6 July 2018); doi: 10.1117/12.2313439
Show Author Affiliations
P. Khosropanah, SRON Netherlands Institute for Space Research (Netherlands)
E. Taralli, SRON Netherlands Institute for Space Research (Netherlands)
L. Gottardi, SRON Netherlands Institute for Space Research (Netherlands)
C. P. de Vries, SRON Netherlands Institute for Space Research (Netherlands)
K. Nagayoshi, SRON Netherlands Institute for Space Research (Netherlands)
M. L. Ridder, SRON Netherlands Institute for Space Research (Netherlands)
H. Akamatsu, SRON Netherlands Institute for Space Research (Netherlands)
M. P. Bruijn, SRON Netherlands Institute for Space Research (Netherlands)
J.-R. Gao, SRON Netherlands Institute for Space Research (Netherlands)
Delft Univ. of Technology (Netherlands)


Published in SPIE Proceedings Vol. 10699:
Space Telescopes and Instrumentation 2018: Ultraviolet to Gamma Ray
Jan-Willem A. den Herder; Shouleh Nikzad; Kazuhiro Nakazawa, Editor(s)

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