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Proceedings Paper

The ESO science archive: supporting and enhancing science from the La Silla Paranal Observatory
Author(s): Martino Romaniello; Stefano Zampieri; Nausicaa Delmotte; Vincenzo Forchì; Olivier Hainaut; Alberto Micol; Jörg Retzlaff; Ignacio Vera; Nathalie Fourniol; Mubashir Ahmed Kahn; Uwe Lange; Devendra Sisodia; Malgorzata Stellert; Felix Stoehr; Magda Arnaboldi; Chiara Spiniello; Laura Mascetti; Michael Fritz Sterzik
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Paper Abstract

The archive of the La Silla Paranal Observatory is a powerful science resource for the ESO astronomical community. It stores both the raw data generated by all ESO instruments and selected processed (science-ready) data. We present the new capabilities and user services that have recently been developed in order to enhance data discovery and usage in the face of the increasing volume and complexity of the archive holdings. Future plans to extend the new services to processed data from the Atacama Large Millimeter/submillimeter Array (ALMA) are also discussed.

Paper Details

Date Published: 10 July 2018
PDF: 9 pages
Proc. SPIE 10704, Observatory Operations: Strategies, Processes, and Systems VII, 1070416 (10 July 2018); doi: 10.1117/12.2311965
Show Author Affiliations
Martino Romaniello, ESO (Germany)
Stefano Zampieri, ESO (Germany)
Nausicaa Delmotte, ESO (Germany)
Vincenzo Forchì, ESO (Germany)
Olivier Hainaut, ESO (Germany)
Alberto Micol, ESO (Germany)
Jörg Retzlaff, ESO (Germany)
Ignacio Vera, ESO (Germany)
Nathalie Fourniol, ESO (Germany)
Mubashir Ahmed Kahn, ESO (Germany)
Uwe Lange, ESO (Germany)
Devendra Sisodia, Pactum Ltd. (United Kingdom)
Malgorzata Stellert, TEKOM Industrielle Systemtechnik GmbH (Germany)
Felix Stoehr, ESO (Germany)
Magda Arnaboldi, ESO (Germany)
Chiara Spiniello, ESO (Germany)
INAF - Osservatorio Astronomico di Capodimonte (Italy)
Laura Mascetti, Terma GmbH (Germany)
Michael Fritz Sterzik, ESO (Germany)

Published in SPIE Proceedings Vol. 10704:
Observatory Operations: Strategies, Processes, and Systems VII
Alison B. Peck; Robert L. Seaman; Chris R. Benn, Editor(s)

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