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Proceedings Paper

The study of VOPc thin film transistors on modified substrates
Author(s): De Song; Qi Xu; Hongcang Cheng; Bao-zeng Li; Yubin Shang
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Paper Abstract

The vanadyl phthalocyanine (VOPc) organic thin film transistors (OTFTs) were fabricated on the various organosilane self-assembled monolayer (SAM) modified substrates. And the effect of the surface properties on the performance of these transistors was studied. The atomic force morphologies and X-ray diffraction (XRD) spectrums of vanadyl phthalocyanine films on different SAM-modified surfaces were studied. They reveal that the terminal functional groups of organosilane affect the growth of VOPc film and device performance. The VOPc film on octadecyltrichlorosilane (OTS) modified substrate has larger crystal size and effective crystal thickness than those on phenyltrichlorosilane (PTS), 1H,1H,2H,2H-Perfluorodec-yltrichlorosilane (FDTS) as well as non-modified substrate, which contributes the mobility of corresponding device several and several dozen times relative to other ones. The effective crystal thickness and crystal grain size of VOPc film on PTS is between that on OTS treated and that on non-modified substrate due to the stronger attractive force between VOPc and SiO2. The VOPc films’ performance and effective crystal thickness on FDTS treated are worse than that on PTS due to the existents of attractive force between –CF3 and VOPc.

Paper Details

Date Published: 20 February 2018
PDF: 6 pages
Proc. SPIE 10697, Fourth Seminar on Novel Optoelectronic Detection Technology and Application, 106970S (20 February 2018); doi: 10.1117/12.2309741
Show Author Affiliations
De Song, Changchun Univ. of Science and Technology (China)
Qi Xu, Changchun Univ. of Science and Technology (China)
Hongcang Cheng, Science and Technology on Low-light-level Night Vision Lab. (China)
Bao-zeng Li, Changchun Univ. of Science and Technology (China)
Yubin Shang, Changchun Univ. of Science and Technology (China)


Published in SPIE Proceedings Vol. 10697:
Fourth Seminar on Novel Optoelectronic Detection Technology and Application
Weiqi Jin; Ye Li, Editor(s)

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