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Proceedings Paper • Open Access

SWIFTS: on-chip very high spectral resolution spectrometer
Author(s): E. le Coarer; L. G. Venancio; P. Kern; J. Ferrand; P. Puget; M. Ayraud; C. Bonneville; B. Demonte; A. Morand; J. Boussey; D. Barbier; S. Blaize; T. Gonthiez

Paper Abstract

The size and the weight of state of the art spectrometers is a serious issue regarding space applications. SWIFTS (Stationary Wave Integrated Fourier Transform Spectrometer) is a new FTS family without any moving part. This very promising technology is an original way to fully sample the Fourier interferogram obtained in a waveguide by either a reflection (SWIFTS Lippmann) or counter-propagative (SWIFTS Gabor) interference phenomenon. The sampling is simultaneously performed the optical path thanks to "nano-detectors" located in the evanescent field of the waveguide. For instance a 1.7cm long waveguide properly associated to the detector achieves directly a resolution of 0.13cm-1 on a few centimetre long instruments. Here, firstly we present the development status of this new kind of spectrometers and the first results obtained with on going development of spectrometer covering simultaneously the visible domain from 400 to 1000 nm like an Echelle spectrometer. Valuable technologies allows one to extend the concept to various wavelength domains. Secondly, we present the results obtained in the frame of an activity funded by the European Space Agency where several potential applications in space missions have been identified and studied.

Paper Details

Date Published: 20 November 2017
PDF: 7 pages
Proc. SPIE 10565, International Conference on Space Optics — ICSO 2010, 105651B (20 November 2017); doi: 10.1117/12.2309259
Show Author Affiliations
E. le Coarer, LAOG, Univ. de Grenoble (France)
L. G. Venancio, ESA-ESTEC (Netherlands)
P. Kern, LAOG, Univ. de Grenoble (France)
J. Ferrand, LAOG, Univ. de Grenoble (France)
P. Puget, LAOG, Univ. de Grenoble (France)
M. Ayraud, e2v (France)
C. Bonneville, e2v (France)
B. Demonte, e2v (France)
A. Morand, IMEP-LAHC (France)
J. Boussey, LTM, Univ. de Grenoble (France)
D. Barbier, Teem Photonics (France)
S. Blaize, LNIO Univ. Technologique de Troyes (France)
T. Gonthiez, Floralis (France)

Published in SPIE Proceedings Vol. 10565:
International Conference on Space Optics — ICSO 2010
Errico Armandillo; Bruno Cugny; Nikos Karafolas, Editor(s)

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