Share Email Print

Proceedings Paper • Open Access

Dynamic MTF measurement
Author(s): Alain Bardoux; Thierry Gimenez; Nicolas Jamin; Frederic Seve

Paper Abstract

MTF (Modulation Transfer Frequency) of a detector is a key parameter for imagers. When image is not moving on the detector, MTF can be measured by some methods (knife edge, slanted slit,…). But with LEO satellites, image is moving on the surface of the detector, and MTF has to be measured in the same way: that is what we call "dynamic MTF". CNES (French Space Agency) has built a specific bench in order to measure dynamic MTF of detectors (CCD and CMOS), especially with component working in TDI (Time delay and integration) mode. The method is based on a moving edge, synchronized with the movement of charges inside the TDI detector. The moving part is a rotating cube, allowing a very stable movement of the image on the surface of the detector The main difficulties were:

- stability of the rotating speed

- synchronization between cube speed and charge transfer inside the detectors

- synchronization between cube position and data acquisition.

Different methods have been tested for the displacement of the knife edge:

- geometrical displacement

- electrical shift of the charge transfer clocks.

Static MTF has been performed before dynamic measurements, in order to fix a reference measurement, Then dynamic MTF bench has been set up. The results, for a TDI CCD show a very good precision. So this bench is validated, and the dynamic MTF value of the TDI CCD is confirmed.

Paper Details

Date Published: 20 November 2017
PDF: 7 pages
Proc. SPIE 10565, International Conference on Space Optics — ICSO 2010, 1056504 (20 November 2017); doi: 10.1117/12.2309157
Show Author Affiliations
Alain Bardoux, Ctr. National d’Etudes Spatiales (France)
Thierry Gimenez, Ctr. National d’Etudes Spatiales (France)
Nicolas Jamin, Pleiades Technologies (France)
Frederic Seve, Pleiades Technologies (France)

Published in SPIE Proceedings Vol. 10565:
International Conference on Space Optics — ICSO 2010
Errico Armandillo; Bruno Cugny; Nikos Karafolas, Editor(s)

© SPIE. Terms of Use
Back to Top