Proceedings Paper
Evaluation and testing of image quality of the Space Solar Extreme Ultraviolet Telescope| Format | Member Price | Non-Member Price |
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Paper Abstract
For the space solar extreme ultraviolet telescope, the star point test can not be performed in the x-ray band (19.5nm band) as there is not light source of bright enough. In this paper, the point spread function of the optical system is calculated to evaluate the imaging performance of the telescope system. Combined with the actual processing surface error, such as small grinding head processing and magnetorheological processing, the optical design software Zemax and data analysis software Matlab are used to directly calculate the system point spread function of the space solar extreme ultraviolet telescope. Matlab codes are programmed to generate the required surface error grid data. These surface error data is loaded to the specified surface of the telescope system by using the communication technique of DDE (Dynamic Data Exchange), which is used to connect Zemax and Matlab. As the different processing methods will lead to surface error with different size, distribution and spatial frequency, the impact of imaging is also different. Therefore, the characteristics of the surface error of different machining methods are studied. Combining with its position in the optical system and simulation its influence on the image quality, it is of great significance to reasonably choose the processing technology. Additionally, we have also analyzed the relationship between the surface error and the image quality evaluation. In order to ensure the final processing of the mirror to meet the requirements of the image quality, we should choose one or several methods to evaluate the surface error according to the different spatial frequency characteristics of the surface error.
Paper Details
Date Published: 12 January 2018
PDF: 9 pages
Proc. SPIE 10621, 2017 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 1062127 (12 January 2018); doi: 10.1117/12.2307664
Published in SPIE Proceedings Vol. 10621:
2017 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
Jigui Zhu; Hwa-Yaw Tam; Kexin Xu; Hai Xiao; Liquan Dong, Editor(s)
PDF: 9 pages
Proc. SPIE 10621, 2017 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 1062127 (12 January 2018); doi: 10.1117/12.2307664
Show Author Affiliations
Jilong Peng, Beijing Institute of Spacecraft Environment Engineering (China)
Zhong Yi, Beijing Institute of Spacecraft Environment Engineering (China)
Science and Technology on Reliability and Environment Engineering Lab. (China)
Shuhong Zhou, Beijing Institute of Technology (China)
Zhong Yi, Beijing Institute of Spacecraft Environment Engineering (China)
Science and Technology on Reliability and Environment Engineering Lab. (China)
Shuhong Zhou, Beijing Institute of Technology (China)
Qian Yu, Beijing Institute of Spacecraft Environment Engineering (China)
Yinlong Hou, Beijing Institute of Technology (China)
Shanshan Wang, Beijing Institute of Technology (China)
Yinlong Hou, Beijing Institute of Technology (China)
Shanshan Wang, Beijing Institute of Technology (China)
Published in SPIE Proceedings Vol. 10621:
2017 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
Jigui Zhu; Hwa-Yaw Tam; Kexin Xu; Hai Xiao; Liquan Dong, Editor(s)
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