Share Email Print

Proceedings Paper

Measurements towards providing security assurance for a chip-scale QKD system
Author(s): A. Vaquero-Stainer; R. A. Kirkwood; V. Burenkov; C. J. Chunnilall; A. G Sinclair; A. Hart; H. Semenenko; P. Sibson; C. Erven; M. G. Thompson
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

Quantum key distribution (QKD) is one of the most commercially-advanced quantum optical technologies operating in the single-photon regime. The commercial success of this disruptive technology relies on customer trust. Network device manufacturers have to meet stringent standards in order to ensure the operational security of their devices. The National Physical Laboratory (NPL) and the University of Bristol (Bristol) are working to produce a suite of tests to determine the operating characteristics and implementation security of chip-scale quantum devices designed for security purposes. These tests will inform and provide assurance to potential customers of such devices. Results from initial measurements performed on the Bristol chip-scale transmitter and receiver are presented, with the aim of informing the development of the system.

Paper Details

Date Published: 21 May 2018
PDF: 8 pages
Proc. SPIE 10674, Quantum Technologies 2018, 106741A (21 May 2018); doi: 10.1117/12.2307409
Show Author Affiliations
A. Vaquero-Stainer, Univ. of York (United Kingdom)
National Physical Lab. (United Kingdom)
R. A. Kirkwood, National Physical Lab. (United Kingdom)
V. Burenkov, Univ. of York (United Kingdom)
National Physical Lab. (United Kingdom)
C. J. Chunnilall, National Physical Lab. (United Kingdom)
A. G Sinclair, National Physical Lab. (United Kingdom)
A. Hart, Univ. of Bristol (United Kingdom)
H. Semenenko, Univ. of Bristol (United Kingdom)
P. Sibson, Univ. of Bristol (United Kingdom)
C. Erven, Univ. of Bristol (United Kingdom)
M. G. Thompson, Univ. of Bristol (United Kingdom)

Published in SPIE Proceedings Vol. 10674:
Quantum Technologies 2018
Jürgen Stuhler; Andrew J. Shields; Miles J. Padgett, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?