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Proceedings Paper

X-ray measurement model and information-theoretic system metric incorporating material variability (Conference Presentation)

Paper Abstract

In our prior work, we had employed a fixed photo-absorption, coherent, and incoherent cross-section material model to derive a shot-noise limited description of the X-ray measurements in check-point or a checked baggage threat-detection systems. Using this measurement model, we developed an information-theoretic metric, which provides an upper-bound on the performance of a threat-detection system. However, the fixed cross-section material model does not incorporate material variability arising from inherent variations in its composition and density. In this work, we develop a multi-energy model of material variability based on composition and density variations and combine it with the shot-noise photon detection process to derive a new X-ray measurement model. We derive a computationally scalable analytic approximation of an information-theoretic metric, i.e. Cauchy-Schwarz mutual information, based on this material variability model to quantify the upper-bound on the performance of the threat-detection task. We demonstrate the effect of material variations on the performance bounds of X-ray transmission-based threat detection systems as a function of detector energy resolution and source fluence.

Paper Details

Date Published: 14 May 2018
Proc. SPIE 10632, Anomaly Detection and Imaging with X-Rays (ADIX) III, 106320H (14 May 2018); doi: 10.1117/12.2307242
Show Author Affiliations
Ahmad Masoudi, The Univ. of Arizona (United Kingdom)
Jay Voris, College of Optical Sciences, The Univ. of Arizona (United States)
David Coccarelli, Duke Univ. (United States)
Joel Greenberg, Duke Univ. (United States)
Michael Gehm, Duke Univ. (United States)
Amit Ashok, College of Optical Sciences, The Univ. of Arizona (United States)

Published in SPIE Proceedings Vol. 10632:
Anomaly Detection and Imaging with X-Rays (ADIX) III
Amit Ashok; Joel A. Greenberg; Michael E. Gehm; Mark A. Neifeld, Editor(s)

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