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Proceedings Paper

Non-destructive method to detect artificially ripened banana using hyperspectral sensing and RGB imaging
Author(s): Mithun B.S.; Sujit Shinde; Karan Bhavsar; Arijit Chowdhury; Shalini Mukhopadhyay; Kavya Gupta; Brojeshwar Bhowmick ; Sanjay Kimbahune
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Paper Abstract

Fruits provide essential nutrition in most natural form suitable for human beings. They are best when ripened naturally. However, industrialization has provided many ways for quick ripening and for extended shelf life of fruits. Detection of artificial ripening could be done by sophisticated methods like chemical analysis in lab or visual inspection by experts, which may not be feasible all the time. Of all the fruits, banana is the most consumed fruit around the world. Adulteration of banana can have devastating effects on masses on scale. It is figured, bananas are potentially ripened using carcinogens like Calcium Carbide(CaC2). In this paper, we propose and devise a novel and automatic method to classify the naturally and artificially ripened banana using spectral and RGB data. Our results show that using a Deep Learning (Neural Network) on RGB data, we achieve accuracy of up-to 90%.and using Random Forest and Multilayer Perceptron (MLP) feed forward Neural Network as classifiers on spectral data we can achieve accuracies of up-to 98.74% and 89.49% respectively.

Paper Details

Date Published: 15 May 2018
PDF: 9 pages
Proc. SPIE 10665, Sensing for Agriculture and Food Quality and Safety X, 106650T (15 May 2018); doi: 10.1117/12.2306367
Show Author Affiliations
Mithun B.S., Tata Consultancy Services Ltd. (India)
Sujit Shinde, Tata Consultancy Services Ltd. (India)
Karan Bhavsar, Tata Consultancy Services Ltd. (India)
Arijit Chowdhury, Tata Consultancy Services Ltd. (India)
Shalini Mukhopadhyay, Tata Consultancy Services Ltd. (India)
Kavya Gupta, Tata Consultancy Services Ltd. (India)
Brojeshwar Bhowmick , Tata Consultancy Services Ltd. (India)
Sanjay Kimbahune, Tata Consultancy Services Ltd. (India)

Published in SPIE Proceedings Vol. 10665:
Sensing for Agriculture and Food Quality and Safety X
Moon S. Kim; Kuanglin Chao; Bryan A. Chin; Byoung-Kwan Cho, Editor(s)

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