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Proceedings Paper

The design of high precision temperature control system for InGaAs short-wave infrared detector
Author(s): Zheng-yun Wang; Yadong Hu; Chen Ni; Lin Huang; Aiwen Zhang; Xiao-bing Sun; Jin Hong
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Paper Abstract

The InGaAs Short-wave infrared detector is a temperature-sensitive device. Accurate temperature control can effectively reduce the background signal and improve detection accuracy, detection sensitivity, and the SNR of the detection system. Firstly, the relationship between temperature and detection background, NEP is analyzed, the principle of TEC and formula between cooling power, cooling current and hot-cold interface temperature difference are introduced. Then, the high precision constant current drive circuit based on triode voltage control current, and an incremental algorithm model based on deviation tracking compensation and PID control are proposed, which effectively suppresses the temperature overshoot, overcomes the temperature inertia, and has strong robustness. Finally, the detector and temperature control system are tested. Results show that: the lower of detector temperature, the smaller the temperature fluctuation, the higher the detection accuracy and the detection sensitivity. The temperature control system achieves the high temperature control with the temperature control rate is 7~8°C/min and the temperature fluctuation is better than ±0. 04°C.

Paper Details

Date Published: 20 February 2018
PDF: 8 pages
Proc. SPIE 10697, Fourth Seminar on Novel Optoelectronic Detection Technology and Application, 1069703 (20 February 2018); doi: 10.1117/12.2305890
Show Author Affiliations
Zheng-yun Wang, Anhui Institute of Optics and FineMechanics (China)
Yadong Hu, Anhui Institute of Optics and Fine Mechanics (China)
Chen Ni, Beijing Space Vehicle General Design Dept. (China)
Lin Huang, Beijing Satellite Manufacturing Plant (China)
Aiwen Zhang, Anhui Institute of Optics and Fine Mechanics (China)
Xiao-bing Sun, Anhui Institute of Optics and Fine Mechanics (China)
Jin Hong, Anhui Institute of Optics and Fine Mechanics (China)


Published in SPIE Proceedings Vol. 10697:
Fourth Seminar on Novel Optoelectronic Detection Technology and Application
Weiqi Jin; Ye Li, Editor(s)

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