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Proceedings Paper

Features of Talbot effect on phase diffraction grating
Author(s): Denis G. Brazhnikov; Volodymyr P. Danko; Myhaylo M. Kotov; Andriy V. Kovalenko
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Paper Abstract

The features of the Talbot effect using the phase diffraction gratings have been considered. A phase grating, unlike an amplitude grating, gives a constant light intensity in the observation plane at a distance multiple to half of the Talbot length ZT. In this case, the subject of interest consists in so-called fractional Talbot effect with the periodic intensity distribution observed in planes shifted from the position nZT/2 (the so-called Fresnel images). Binary phase diffraction gratings with varying phase steps have been investigated. Gratings were made photographically on holographic plates PFG-01. The phase shift was obtained by modulating the emulsion refraction index of the plates. Two types of gratings were used: a square grating with a fill factor of 0.5 and a checkerwise grating (square areas with a bigger and lower refractive index alternate in a checkerboard pattern). By the example of these gratings, the possibility of obtaining in the observation plane an image of a set of equidistant spots with a size smaller than the size of the phase-shifting elements of the grating (the so-called Talbot focusing) has been shown. Clear images of spots with a sufficient signal-to-noise ratio have been obtained for a square grating. Their period was equal to the period of the grating. For a grating with a checkerwise distribution of the refractive index, the spots have been located in positions corresponding to the centres of cells. In addition, the quality of the resulting pattern strongly depended on the magnitude of a grating phase step. As a result of the work, the possibility to obtain Talbot focusing has been shown and the use of this effect to wavefront investigation with a gradient sensor has been demonstrated.

Paper Details

Date Published: 18 January 2018
PDF: 7 pages
Proc. SPIE 10612, Thirteenth International Conference on Correlation Optics, 106120J (18 January 2018); doi: 10.1117/12.2304904
Show Author Affiliations
Denis G. Brazhnikov, Taras Shevchenko National Univ. of Kyiv (Ukraine)
Volodymyr P. Danko, Taras Shevchenko National Univ. of Kyiv (Ukraine)
Myhaylo M. Kotov, Taras Shevchenko National Univ. of Kyiv (Ukraine)
Andriy V. Kovalenko, Taras Shevchenko National Univ. of Kyiv (Ukraine)

Published in SPIE Proceedings Vol. 10612:
Thirteenth International Conference on Correlation Optics
Oleg V. Angelsky, Editor(s)

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