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Proceedings Paper

Modulation transfer function measurements on a MWIR T2SL focal plane array in IDDCA configuration
Author(s): Jean Nghiem; Sylvie Bernhardt; Julien Jaeck; Sophie Derelle; Edouard Huard; Jérôme Primot; Linda Höglund; Eric Costard; Philippe Christol; Isabelle Ribet-Mohamed
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Paper Abstract

Type-II InAs/GaSb superlattice (T2SL) has recently matured into a commercially available technology addressing both MWIR and LWIR spectral domains. As the prerequisites such as Quantum Efficiency (QE) and dark current were met, more advanced figures of merits related to the ElectroOptic (EO) system as a whole can now be studied in order to position this technology. In this paper, we focus on modulation transfer function (MTF) measurements. Knowing the MTF of a detector is indeed of primary importance for the EO system designers, since spatial filtering affects the system range. We realized MTF measurements on a 320x256 MWIR T2SL FPA provided by IRnova, using a Continuously Self Imaging Grating (CSIG). The advantage of this experimental configuration is that no high performance projection optics is required. Indeed, the CSIG exploits the self-imaging property (known as Talbot effect) to project a pattern with known spatial frequencies on the photodetector. Such MTF measurements have never been done in Integrated Detector Dewar Cooler Assembly (IDDCA) configuration, so we had to study the effect of the vibrations induced by the cryocooler. Vibrations indeed affect the MTF measurement in the same way electrical diffusion would do. Using three accelerometers we optimized our experimental setup and extracted MTF measurements with reduced vibrations. The pixel size is 26μm for a pitch of 30μm.

Paper Details

Date Published: 26 April 2018
PDF: 7 pages
Proc. SPIE 10625, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXIX, 1062508 (26 April 2018); doi: 10.1117/12.2304793
Show Author Affiliations
Jean Nghiem, ONERA (France)
Sylvie Bernhardt, ONERA (France)
Julien Jaeck, ONERA (France)
Sophie Derelle, ONERA (France)
Edouard Huard, ONERA (France)
Jérôme Primot, ONERA (France)
Linda Höglund, IRnova AB (Sweden)
Eric Costard, IRnova AB (Sweden)
Philippe Christol, Univ. Montpellier, Institut d'Électronique et des Systèmes (France)
Isabelle Ribet-Mohamed, ONERA (France)

Published in SPIE Proceedings Vol. 10625:
Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXIX
Gerald C. Holst; Keith A. Krapels, Editor(s)

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