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Proceedings Paper

Research on an optoelectronic measurement system of dynamic envelope measurement for China Railway high-speed train
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Paper Abstract

The dynamic envelope measurement plays very important role in the external dimension design for high-speed train. Recently there is no digital measurement system to solve this problem. This paper develops an optoelectronic measurement system by using monocular digital camera, and presents the research of measurement theory, visual target design, calibration algorithm design, software programming and so on. This system consists of several CMOS digital cameras, several luminous targets for measuring, a scale bar, data processing software and a terminal computer. The system has such advantages as large measurement scale, high degree of automation, strong anti-interference ability, noise rejection and real-time measurement. In this paper, we resolve the key technology such as the transformation, storage and calculation of multiple cameras’ high resolution digital image. The experimental data show that the repeatability of the system is within 0.02mm and the distance error of the system is within 0.12mm in the whole workspace. This experiment has verified the rationality of the system scheme, the correctness, the precision and effectiveness of the relevant methods.

Paper Details

Date Published: 12 January 2018
PDF: 8 pages
Proc. SPIE 10621, 2017 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 1062126 (12 January 2018); doi: 10.1117/12.2304291
Show Author Affiliations
Ziyue Zhao, Changcheng Institute of Metrology and Measurement (China)
Aviation Industry Corp. of China (China)
Xiaochuan Gan, Changcheng Institute of Metrology and Measurement (China)
Aviation Industry Corp. of China (China)
Zhi Zou, Changcheng Institute of Metrology and Measurement (China)
Aviation Industry Corp. of China (China)
Liqun Ma, Changcheng Institute of Metrology and Measurement (China)
Aviation Industry Corp. of China (China)


Published in SPIE Proceedings Vol. 10621:
2017 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
Jigui Zhu; Hwa-Yaw Tam; Kexin Xu; Hai Xiao; Liquan Dong, Editor(s)

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