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Proceedings Paper

A design of a high speed dual spectrometer by single line scan camera
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Paper Abstract

A spectrometer that can capture two orthogonal polarization components of s light beam is demanded for polarization sensitive imaging system. Here, we describe the design and implementation of a high speed spectrometer for simultaneous capturing of two orthogonal polarization components, i.e. vertical and horizontal components, of light beam. The design consists of a polarization beam splitter, two polarization-maintain optical fibers, two collimators, a single line-scan camera, a focusing lens, and a reflection blaze grating. The alignment of two beam paths was designed to be symmetrically incident on the blaze side and reverse blaze side of reflection grating, respectively. The two diffracted beams were passed through the same focusing lens and focused on the single line-scan sensors of a CMOS camera. The two spectra of orthogonal polarization were imaged on 1000 pixels per spectrum. With the proposed setup, the amplitude and shape of the two detected spectra can be controlled by rotating the collimators. The technique for optical alignment of spectrometer will be presented and discussed. The two orthogonal polarization spectra can be simultaneously captured at a speed of 70,000 spectra per second. The high speed dual spectrometer can simultaneously detected two orthogonal polarizations, which is an important component for the development of polarization-sensitive optical coherence tomography. The performance of the spectrometer have been measured and analyzed.

Paper Details

Date Published: 5 March 2018
PDF: 6 pages
Proc. SPIE 10714, Third International Conference on Photonics Solutions (ICPS2017), 107140R (5 March 2018); doi: 10.1117/12.2300958
Show Author Affiliations
Kunakorn Palawong, Suranaree Univ. of Technology (Thailand)
Panomsak Meemon, Suranaree Univ. of Technology (Thailand)

Published in SPIE Proceedings Vol. 10714:
Third International Conference on Photonics Solutions (ICPS2017)
Thawatchai Mayteevarunyoo, Editor(s)

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