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Proceedings Paper

Temperature effects on wavelength calibration of the optical spectrum analyzer
Author(s): Kittiphong Mongkonsatit; Monludee Ranusawud; Sitthichai Srikham; Apichai Bhatranand; Yuttapong Jiraraksopakun
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Paper Abstract

This paper presents the investigation of the temperature effects on wavelength calibration of an optical spectrum analyzer or OSA. The characteristics of wavelength dependence on temperatures are described and demonstrated under the guidance of the IEC 62129-1:2006, the international standard for the Calibration of wavelength/optical frequency measurement instruments – Part 1: Optical spectrum analyzer. Three distributed-feedback lasers emit lights with wavelengths of 1310 nm, 1550 nm, and 1600 nm were used as light sources in this work. Each light was split by a 1 x 2 fiber splitter whereas one end was connected to a standard wavelength meter and the other to an under-test OSA. Two Experiment setups were arranged for the analysis of the wavelength reading deviations between a standard wavelength meter and an OSA under a variety of circumstances of different temperatures and humidity conditions. The experimental results showed that, for wavelengths of 1550 nm and 1600 nm, the wavelength deviations were proportional to the value of temperature with the minimum and maximum of -0.015 and 0.030 nm, respectively. While the deviations of 1310 nm wavelength did not change much with the temperature as they were in the range of -0.003 nm to 0.010 nm. The measurement uncertainty was also evaluated according to the IEC 62129-1:2006. The main contribution of measurement uncertainty was caused by the wavelength deviation. The uncertainty of measurement in this study is 0.023 nm with coverage factor, k = 2.

Paper Details

Date Published: 5 March 2018
PDF: 5 pages
Proc. SPIE 10714, Third International Conference on Photonics Solutions (ICPS2017), 107140E (5 March 2018); doi: 10.1117/12.2299638
Show Author Affiliations
Kittiphong Mongkonsatit, King Mongkut’s Univ. of Technology Thonburi (Thailand)
Monludee Ranusawud, National Institute of Metrology (Thailand) (Thailand)
Sitthichai Srikham, National Institute of Metrology (Thailand) (Thailand)
Apichai Bhatranand, King Mongkut’s Univ. of Technology Thonburi (Thailand)
Yuttapong Jiraraksopakun, King Mongkut’s Univ. of Technology Thonburi (Thailand)

Published in SPIE Proceedings Vol. 10714:
Third International Conference on Photonics Solutions (ICPS2017)
Thawatchai Mayteevarunyoo, Editor(s)

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