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Proceedings Paper

Investigation of the electron distributionin CdxHg1-xTe superlattices by far infrared and Raman spectroscopy
Author(s): S. K. Kang
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Paper Abstract

Far infrared spectroscopy may be used in obtaining characterisation information on superlattices containingfree carriers; such information complements that obtained by Raman spectroscopy. This study makes use ofboth infrared and Raman measurements on CdxHgl_xTe (CMT) superlattice samples.

Paper Details

Date Published: 30 August 1993
PDF: 2 pages
Proc. SPIE 2104, 18th International Conference on Infrared and Millimeter Waves, 210438 (30 August 1993); doi: 10.1117/12.2298548
Show Author Affiliations
S. K. Kang, Univ. of Essex (United Kingdom)

Published in SPIE Proceedings Vol. 2104:
18th International Conference on Infrared and Millimeter Waves
James R. Birch; Terence J. Parker, Editor(s)

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