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Proceedings Paper

Experimental studies with open resonators on frequency dependent dielectric loss at mm-wavelengths
Author(s): V. V. Parshin
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Paper Abstract

Open resonators, both of the spherical and hemispherical geometry, have beenused in different sizes and configurations to measure the dielectric loss tangentof tow toss dielectrics at numerous frequency spots between 15 GHz and 300 GHz.Data were obtained at room temperature for Sapphire, Quartz and High Resistivi- ty Silicon.

Paper Details

Date Published: 30 August 1993
PDF: 1 pages
Proc. SPIE 2104, 18th International Conference on Infrared and Millimeter Waves, 21040W (30 August 1993); doi: 10.1117/12.2298464
Show Author Affiliations
V. V. Parshin, Applied Physics Institute (Russian Federation)


Published in SPIE Proceedings Vol. 2104:
18th International Conference on Infrared and Millimeter Waves
James R. Birch; Terence J. Parker, Editor(s)

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