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Proceedings Paper • Open Access

Backside illuminated CMOS-TDI line scanner for space applications
Author(s): O. Cohen; N. Ben-Ari; I. Nevo; N. Shiloah; G. Zohar; E. Kahanov; M. Brumer; G. Gershon; O. Ofer

Paper Abstract

A new multi-spectral line scanner CMOS image sensor is reported. The backside illuminated (BSI) image sensor was designed for continuous scanning Low Earth Orbit (LEO) space applications including A custom high quality CMOS Active Pixels, Time Delayed Integration (TDI) mechanism that increases the SNR, 2-phase exposure mechanism that increases the dynamic Modulation Transfer Function (MTF), very low power internal Analog to Digital Converters (ADC) with resolution of 12 bit per pixel and on chip controller. The sensor has 4 independent arrays of pixels where each array is arranged in 2600 TDI columns with controllable TDI depth from 8 up to 64 TDI levels. A multispectral optical filter with specific spectral response per array is assembled at the package level. In this paper we briefly describe the sensor design and present some electrical and electro-optical recent measurements of the first prototypes including high Quantum Efficiency (QE), high MTF, wide range selectable Full Well Capacity (FWC), excellent linearity of approximately 1.3% in a signal range of 5-85% and approximately 1.75% in a signal range of 2-95% out of the signal span, readout noise of approximately 95 electrons with 64 TDI levels, negligible dark current and power consumption of less than 1.5W total for 4 bands sensor at all operation conditions .

Paper Details

Date Published: 25 September 2017
PDF: 9 pages
Proc. SPIE 10562, International Conference on Space Optics — ICSO 2016, 105622L (25 September 2017); doi: 10.1117/12.2296144
Show Author Affiliations
O. Cohen, SCD SemiConductor Devices (Israel)
N. Ben-Ari, SCD SemiConductor Devices (Israel)
I. Nevo, SCD SemiConductor Devices (Israel)
N. Shiloah, SCD SemiConductor Devices (Israel)
G. Zohar, SCD SemiConductor Devices (Israel)
E. Kahanov, SCD SemiConductor Devices (Israel)
M. Brumer, SCD SemiConductor Devices (Israel)
G. Gershon, SCD SemiConductor Devices (Israel)
O. Ofer, SCD SemiConductor Devices (Israel)


Published in SPIE Proceedings Vol. 10562:
International Conference on Space Optics — ICSO 2016
Bruno Cugny; Nikos Karafolas; Zoran Sodnik, Editor(s)

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