Proceedings Paper
Two-tone spectrum analysis for self-referenced characterization of high-speed phase modulators| Format | Member Price | Non-Member Price |
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Paper Abstract
A two-tone spectrum analysis method is proposed for self-referenced microwave characterization of high-speed electro-optic phase modulators (PMs) based on the frequency-shifted heterodyning. The method avoids correcting the roll-off responsivity of photodetection and alleviates the bandwidth requirements of the high-speed photodetector and the electrical spectrum analyzer. Moreover, it achieves very high frequency resolution and high stability measurement by the use of the two-tone frequency-shifted heterodyning.
Paper Details
Date Published: 12 January 2018
PDF: 6 pages
Proc. SPIE 10621, 2017 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 106210M (12 January 2018); doi: 10.1117/12.2295659
Published in SPIE Proceedings Vol. 10621:
2017 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
Jigui Zhu; Hwa-Yaw Tam; Kexin Xu; Hai Xiao; Liquan Dong, Editor(s)
PDF: 6 pages
Proc. SPIE 10621, 2017 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 106210M (12 January 2018); doi: 10.1117/12.2295659
Show Author Affiliations
Heng Wang, Univ. of Electronic Science and Technology of China (China)
Xinhai Zou, Univ. of Electronic Science and Technology of China (China)
Mengke Wang, Univ. of Electronic Science and Technology of China (China)
Xinhai Zou, Univ. of Electronic Science and Technology of China (China)
Mengke Wang, Univ. of Electronic Science and Technology of China (China)
Shangjian Zhang, Univ. of Electronic Science and Technology of China (China)
Yong Liu, Univ. of Electronic Science and Technology of China (China)
Yong Liu, Univ. of Electronic Science and Technology of China (China)
Published in SPIE Proceedings Vol. 10621:
2017 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
Jigui Zhu; Hwa-Yaw Tam; Kexin Xu; Hai Xiao; Liquan Dong, Editor(s)
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