Proceedings Paper
The measurement of luminous flux for single LEDs| Format | Member Price | Non-Member Price |
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Paper Abstract
The total luminous flux is one of the most important characteristics of a LED. According to the CIE standard, the luminous flux for LEDs can be measured by an integrating sphere equipped with a spectroradiometer. The luminous flux of LEDs has been measured in the 4π geometry, which is suitable for LEDs with different luminous intensity distributions. The results between NIM and SIMT validate our calibration ability. The experiments indicate that the standard LEDs and the measurement repeatability play important roles in the uncertainty analysis.
Paper Details
Date Published: 12 January 2018
PDF: 6 pages
Proc. SPIE 10621, 2017 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 1062120 (12 January 2018); doi: 10.1117/12.2295606
Published in SPIE Proceedings Vol. 10621:
2017 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
Jigui Zhu; Hwa-Yaw Tam; Kexin Xu; Hai Xiao; Liquan Dong, Editor(s)
PDF: 6 pages
Proc. SPIE 10621, 2017 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 1062120 (12 January 2018); doi: 10.1117/12.2295606
Show Author Affiliations
Tiecheng Li, Shanghai Institute of Measurement and Testing Technology (China)
Jiangang Zhu, Shanghai Institute of Measurement and Testing Technology (China)
Muyao Ji, Shanghai Institute of Measurement and Testing Technology (China)
Fangsheng Lin, Shanghai Institute of Measurement and Testing Technology (China)
Jiangang Zhu, Shanghai Institute of Measurement and Testing Technology (China)
Muyao Ji, Shanghai Institute of Measurement and Testing Technology (China)
Fangsheng Lin, Shanghai Institute of Measurement and Testing Technology (China)
Biyong Huang, Shanghai Institute of Measurement and Testing Technology (China)
Lei Lai, Shanghai Institute of Measurement and Testing Technology (China)
Leibing Shi, Shanghai Institute of Measurement and Testing Technology (China)
Ming Xia, Shanghai Institute of Measurement and Testing Technology (China)
Lei Lai, Shanghai Institute of Measurement and Testing Technology (China)
Leibing Shi, Shanghai Institute of Measurement and Testing Technology (China)
Ming Xia, Shanghai Institute of Measurement and Testing Technology (China)
Published in SPIE Proceedings Vol. 10621:
2017 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
Jigui Zhu; Hwa-Yaw Tam; Kexin Xu; Hai Xiao; Liquan Dong, Editor(s)
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