
Proceedings Paper
Research on key technology of the verification system of steel rule based on vision measurementFormat | Member Price | Non-Member Price |
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Paper Abstract
The steel rule plays an important role in quantity transmission. However, the traditional verification method of steel rule based on manual operation and reading brings about low precision and low efficiency. A machine vison based verification system of steel rule is designed referring to JJG1-1999-Verificaiton Regulation of Steel Rule [1]. What differentiates this system is that it uses a new calibration method of pixel equivalent and decontaminates the surface of steel rule. Experiments show that these two methods fully meet the requirements of the verification system. Measuring results strongly prove that these methods not only meet the precision of verification regulation, but also improve the reliability and efficiency of the verification system.
Paper Details
Date Published: 12 January 2018
PDF: 8 pages
Proc. SPIE 10621, 2017 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 106211X (12 January 2018); doi: 10.1117/12.2295532
Published in SPIE Proceedings Vol. 10621:
2017 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
Jigui Zhu; Hwa-Yaw Tam; Kexin Xu; Hai Xiao; Liquan Dong, Editor(s)
PDF: 8 pages
Proc. SPIE 10621, 2017 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 106211X (12 January 2018); doi: 10.1117/12.2295532
Show Author Affiliations
Siyuan Jia, Tianjin Univ. (China)
Zhong Wang, Tianjin Univ. (China)
Changjie Liu, Tianjin Univ. (China)
Zhong Wang, Tianjin Univ. (China)
Changjie Liu, Tianjin Univ. (China)
Luhua Fu, Tianjin Univ. (China)
Yiming Li, Tianjin Univ. (China)
Ruijun Lu, Tianjin Institute Metrological Supervision and Testing (China)
Yiming Li, Tianjin Univ. (China)
Ruijun Lu, Tianjin Institute Metrological Supervision and Testing (China)
Published in SPIE Proceedings Vol. 10621:
2017 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
Jigui Zhu; Hwa-Yaw Tam; Kexin Xu; Hai Xiao; Liquan Dong, Editor(s)
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