
Proceedings Paper
Temperature measurement of burning aluminum powder based on the double line method of atomic emission spectraFormat | Member Price | Non-Member Price |
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Paper Abstract
In the case of conventional contact temperature measurement, there is a delay phenomenon and high temperature resistant materials limitation. By using the faster response speed and theoretically no upper limit of the non-contact temperature method, the measurement system based on the principle of double line atomic emission spectroscopy temperature measurement is put forward, the structure and theory of temperature measuring device are introduced. According to the atomic spectrum database (ASD), Aluminum(Al) I 690.6 nm and Al I 708.5 nm are selected as the two lines in the temperature measurement. The intensity ratio of the two emission lines was measured by a spectrometer to obtain the temperature of Al burning in pure oxygen, and the result compared to the temperature measured by the thermocouple. It turns out that the temperature correlation between the two methods is good, and it proves the feasibility of the method.
Paper Details
Date Published: 12 January 2018
PDF: 8 pages
Proc. SPIE 10621, 2017 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 106211M (12 January 2018); doi: 10.1117/12.2295292
Published in SPIE Proceedings Vol. 10621:
2017 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
Jigui Zhu; Hwa-Yaw Tam; Kexin Xu; Hai Xiao; Liquan Dong, Editor(s)
PDF: 8 pages
Proc. SPIE 10621, 2017 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 106211M (12 January 2018); doi: 10.1117/12.2295292
Show Author Affiliations
Xiaotao Hu, North Univ. of China (China)
Published in SPIE Proceedings Vol. 10621:
2017 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
Jigui Zhu; Hwa-Yaw Tam; Kexin Xu; Hai Xiao; Liquan Dong, Editor(s)
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