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Proceedings Paper

Layer-number dependent reflection spectra of WS2 and WSe2 flakes on SiO2/Si substrate
Author(s): Xiaoli Li; Xiaofen Qiao; Longlong Wang; Yafang Shi; Weifeng Zhang
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Paper Abstract

Tremendous interest has recently focused on the layered TMDs. Layer number is one of the fundamental parameters in TMDs. In this paper, layer-number dependent reflectivity of WS2 and WSe2 flakes on SiO2/Si substrate were measured by a simple and fast reflection spectrum probing technique. Characteristic excitonic peaks, A and B, and some higher energy density of states excitonic peaks were observed and their properties as a function of layer number were studied. Our results are in agreement with the previous reports.

Paper Details

Date Published: 12 January 2018
PDF: 10 pages
Proc. SPIE 10621, 2017 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 106210J (12 January 2018); doi: 10.1117/12.2295111
Show Author Affiliations
Xiaoli Li, Hebei Univ. (China)
Institute of Semiconductors (China)
Xiaofen Qiao, Institute of Semiconductors (China)
Longlong Wang, Hebei Univ. (China)
Yafang Shi, Hebei Univ. (China)
Weifeng Zhang, Hebei Univ. (China)


Published in SPIE Proceedings Vol. 10621:
2017 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
Jigui Zhu; Hwa-Yaw Tam; Kexin Xu; Hai Xiao; Liquan Dong, Editor(s)

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