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Proceedings Paper

The implementation of depth measurement and related algorithms based on binocular vision in embedded AM5728
Author(s): Zhiwei Deng; Xicai Li; Junsheng Shi; Xiaoqiao Huang; Feiyan Li
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Paper Abstract

Depth measurement is the most basic measurement in various machine vision, such as automatic driving, unmanned aerial vehicle (UAV), robot and so on. And it has a wide range of use. With the development of image processing technology and the improvement of hardware miniaturization and processing speed, real-time depth measurement using dual cameras has become a reality. In this paper, an embedded AM5728 and the ordinary low-cost dual camera is used as the hardware platform. The related algorithms of dual camera calibration, image matching and depth calculation have been studied and implemented on the hardware platform, and hardware design and the rationality of the related algorithms of the system are tested. The experimental results show that the system can realize simultaneous acquisition of binocular images, switching of left and right video sources, display of depth image and depth range. For images with a resolution of 640 × 480, the processing speed of the system can be up to 25 fps. The experimental results show that the optimal measurement range of the system is from 0.5 to 1.5 meter, and the relative error of the distance measurement is less than 5%. Compared with the PC, ARM11 and DMCU hardware platforms, the embedded AM5728 hardware is good at meeting real-time depth measurement requirements in ensuring the image resolution.

Paper Details

Date Published: 12 January 2018
PDF: 7 pages
Proc. SPIE 10620, 2017 International Conference on Optical Instruments and Technology: Optoelectronic Imaging/Spectroscopy and Signal Processing Technology, 106201A (12 January 2018); doi: 10.1117/12.2294510
Show Author Affiliations
Zhiwei Deng, Yunnan Key Lab. of Optoelectronic Information Technology (China)
Yunnan Normal Univ. (China)
Xicai Li, Yunnan Key Lab. of Optoelectronic Information Technology (China)
Yunnan Normal Univ. (China)
Junsheng Shi, Yunnan Key Lab. of Optoelectronic Information Technology (China)
Yunnan Normal Univ. (China)
Xiaoqiao Huang, Yunnan Key Lab. of Optoelectronic Information Technology (China)
Yunnan Normal Univ. (China)
Feiyan Li, Yunnan Key Lab. of Optoelectronic Information Technology (China)
Yunnan Normal Univ. (China)


Published in SPIE Proceedings Vol. 10620:
2017 International Conference on Optical Instruments and Technology: Optoelectronic Imaging/Spectroscopy and Signal Processing Technology
Guohai Situ; Xun Cao; Wolfgang Osten; Liquan Dong, Editor(s)

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