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Proceedings Paper

Real-time micro-vibration multi-spot synchronous measurement within a region based on heterodyne interference
Author(s): Ma Lan; Wen Xiao; Zonghui Chen; Hongliang Hao; Feng Pan
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Paper Abstract

Real-time micro-vibration measurement is widely used in engineering applications. It is very difficult for traditional optical detection methods to achieve real-time need in a relatively high frequency and multi-spot synchronous measurement of a region at the same time,especially at the nanoscale. Based on the method of heterodyne interference, an experimental system of real-time measurement of micro - vibration is constructed to satisfy the demand in engineering applications. The vibration response signal is measured by combing optical heterodyne interferometry and a high-speed CMOS-DVR image acquisition system. Then, by extracting and processing multiple pixels at the same time, four digital demodulation technique are implemented to simultaneously acquire the vibrating velocity of the target from the recorded sequences of images. Different kinds of demodulation algorithms are analyzed and the results show that these four demodulation algorithms are suitable for different interference signals. Both autocorrelation algorithm and cross-correlation algorithm meet the needs of real-time measurements. The autocorrelation algorithm demodulates the frequency more accurately, while the cross-correlation algorithm is more accurate in solving the amplitude.

Paper Details

Date Published: 12 January 2018
PDF: 12 pages
Proc. SPIE 10621, 2017 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 1062118 (12 January 2018); doi: 10.1117/12.2292664
Show Author Affiliations
Ma Lan, Beihang Univ. (China)
Wen Xiao, Beihang Univ. (China)
Zonghui Chen, Beihang Univ. (China)
Hongliang Hao, Beihang Univ. (China)
Feng Pan, Beihang Univ. (China)

Published in SPIE Proceedings Vol. 10621:
2017 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
Jigui Zhu; Hwa-Yaw Tam; Kexin Xu; Hai Xiao; Liquan Dong, Editor(s)

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