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Proceedings Paper

Latest advancements in state-of-the-art aSi-based x-ray flat panel detectors
Author(s): Thierry Ducourant; Thibaut Wirth; Guillaume Bacher; Bruno Bosset; Jean-Michel Vignolle; David Blanchon; Farid Betraoui; Pierre Rohr
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Paper Abstract

Since aSi-based Flat Panel Detectors (FPD) were introduced in the early 2000’s with Trixell first generation of products considerable improvements have been brought incrementally to the products architectures and core technologies. Today, the 3rd generation of detectors achieve performances that seemed unreachable a decade ago … By combining advanced amorphous Silicon (aSi) sensor plate processes, high absorption and low ghosting indirect deposition CsI and the last generation of very fast and low noise readout ICs, detectors can run over 300 frame per second (fps) in binned mode and 60 fps in full resolution, while keeping sub 1000 e- electronic noise and maintaining Detective Quantum Efficiency (DQE) @5 nGy, @1 lp/mm, above 45%. This paper will show that a consistent product platform has been built around these optimized building blocks and that this platform is now ready for a complete portfolio allowing to serve the most demanding applications such as Radiography, ultra-low dose fluoroscopy, and even CT-like 3D imaging.

Paper Details

Date Published: 9 March 2018
PDF: 11 pages
Proc. SPIE 10573, Medical Imaging 2018: Physics of Medical Imaging, 105735V (9 March 2018); doi: 10.1117/12.2291908
Show Author Affiliations
Thierry Ducourant, Trixell (France)
Thibaut Wirth, Trixell (France)
Guillaume Bacher, Trixell (France)
Bruno Bosset, Trixell (France)
Jean-Michel Vignolle, Trixell (France)
David Blanchon, Trixell (France)
Farid Betraoui, Trixell (France)
Pierre Rohr, Trixell (France)


Published in SPIE Proceedings Vol. 10573:
Medical Imaging 2018: Physics of Medical Imaging
Joseph Y. Lo; Taly Gilat Schmidt; Guang-Hong Chen, Editor(s)

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