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Proceedings Paper

Fusion of LBP and SWLD using spatio-spectral information for hyperspectral face recognition
Author(s): Zhihua Xie; Peng Jiang; Shuai Zhang; Jinquan Xiong
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Paper Abstract

Hyperspectral imaging, recording intrinsic spectral information of the skin cross different spectral bands, become an important issue for robust face recognition. However, the main challenges for hyperspectral face recognition are high data dimensionality, low signal to noise ratio and inter band misalignment. In this paper, hyperspectral face recognition based on LBP (Local binary pattern) and SWLD (Simplified Weber local descriptor) is proposed to extract discriminative local features from spatio-spectral fusion information. Firstly, the spatio-spectral fusion strategy based on statistical information is used to attain discriminative features of hyperspectral face images. Secondly, LBP is applied to extract the orientation of the fusion face edges. Thirdly, SWLD is proposed to encode the intensity information in hyperspectral images. Finally, we adopt a symmetric Kullback-Leibler distance to compute the encoded face images. The hyperspectral face recognition is tested on Hong Kong Polytechnic University Hyperspectral Face database (PolyUHSFD). Experimental results show that the proposed method has higher recognition rate (92.8%) than the state of the art hyperspectral face recognition algorithms.

Paper Details

Date Published: 12 January 2018
PDF: 6 pages
Proc. SPIE 10620, 2017 International Conference on Optical Instruments and Technology: Optoelectronic Imaging/Spectroscopy and Signal Processing Technology, 1062016 (12 January 2018); doi: 10.1117/12.2291611
Show Author Affiliations
Zhihua Xie, Jiangxi Sciences and Technology Normal Univ. (China)
Peng Jiang, Jiangxi Sciences and Technology Normal Univ. (China)
Shuai Zhang, Jiangxi Sciences and Technology Normal Univ. (China)
Jinquan Xiong, Nanchang Normal Univ. (China)


Published in SPIE Proceedings Vol. 10620:
2017 International Conference on Optical Instruments and Technology: Optoelectronic Imaging/Spectroscopy and Signal Processing Technology
Guohai Situ; Xun Cao; Wolfgang Osten; Liquan Dong, Editor(s)

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