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Proceedings Paper

Polarization sensitivity of ordered and random antireflective surface structures in silica and spinel
Author(s): J. A. Frantz; J. Selby; L. E. Busse; L. B. Shaw; I. D. Aggarwal; J. S. Sanghera
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Paper Abstract

Both ordered and random anti-reflective surface structures (ARSS) have been shown to increase the transmission of an optical surface to >99.9%. These structures are of great interest as an alternative to traditional thin film anti-reflection (AR) coatings for a variety of reasons. Unlike traditional AR coatings, they are patterned directly into the surface of an optic rather than deposited on its surface and are thus not prone to the delamination under thermal cycling that can occur with thin film coatings. Their laser-induced damage thresholds can also be considerably higher. In addition, they provide AR performance over a larger spectral and angular range. It has been previously demonstrated that random ARSSs in silica are remarkably insensitive to incident polarization, with nearly zero variation in transmittance with respect to polarization of the incident beam at fixed wavelength for angles of incidence up to at least 30°. In this work, we evaluate polarization sensitivity of ARSS as a function of wavelength for both random and ordered ARSS. We demonstrate that ordered ARSS is significantly more sensitive to polarization than random ARSS and explain the reason for this difference. In the case of ordered ARSS, we observe significant differences as a function of wavelength, with the transmittance of s- and p-polarized light diverging near the diffraction edge. We present results for both silica and spinel samples and discuss differences observed for these two sets of samples.

Paper Details

Date Published: 22 February 2018
PDF: 9 pages
Proc. SPIE 10528, Optical Components and Materials XV, 105281E (22 February 2018); doi: 10.1117/12.2289898
Show Author Affiliations
J. A. Frantz, U.S. Naval Research Lab. (United States)
J. Selby, U.S. Naval Research Lab. (United States)
L. E. Busse, U.S. Naval Research Lab. (United States)
L. B. Shaw, U.S. Naval Research Lab. (United States)
I. D. Aggarwal, Sotera Defense Solutions (United States)
J. S. Sanghera, U.S. Naval Research Lab. (United States)

Published in SPIE Proceedings Vol. 10528:
Optical Components and Materials XV
Shibin Jiang; Michel J. F. Digonnet, Editor(s)

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