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Proceedings Paper

Development of InGaAs MPPC for NIR photon counting applications
Author(s): Yusei Tamura; Yoshihito Suzuki; Takuya Fujita; Tomokazu Kurabayashi; Takashi Baba; Kenji Makino; Shigeyuki Nakamura; Koei Yamamoto
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Paper Abstract

An InGaAs Multi-Pixel Photon Counter (MPPC) has been developed for detecting the near-infrared and shortwave infrared wavelength. Numerous studies were made to develop silicon-based photomultipliers with sensitivity in the nearinfrared region, so they can be applied in various applications such as distance ranging. However, achieving sensitivity at 1.0 μm and longer wavelengths was hard to implement. Therefore a hybrid photon counting device was designed by improving the InGaAs avalanche photodiode. In our approach, the sensor layer and the circuit layer are prepared separately, and this configuration brings more flexibility to both layers. The 3x3 pixel matrix and the dedicated circuit were fabricated, and characterizations were performed in terms of the sensitivity uniformity and the other essential parameters of a photon counting device such as dark count rate, photon detection probability and so on. An excellent uniformity was observed across the active regions in both a single device and the 3x3 matrix device, which indicated that no any abrupt breakdowns were formed. The DCR was 844 kHz and PDP was 8% under the typical conditions of Ve = 1.1 V and T = 253 K. The 3x3 matrix device also exhibited the capability of resolving photon numbers, and the result means this work can be applied to numerous photon-counting applications in infrared.

Paper Details

Date Published: 22 February 2018
PDF: 12 pages
Proc. SPIE 10528, Optical Components and Materials XV, 105280Z (22 February 2018); doi: 10.1117/12.2289681
Show Author Affiliations
Yusei Tamura, Hamamatsu Photonics K.K. (Japan)
Yoshihito Suzuki, Hamamatsu Photonics K.K. (Japan)
Takuya Fujita, Hamamatsu Photonics K.K. (Japan)
Tomokazu Kurabayashi, Hamamatsu Photonics K.K. (Japan)
Takashi Baba, Hamamatsu Photonics KK (Japan)
Kenji Makino, Hamamatsu Photonics K.K. (Japan)
Shigeyuki Nakamura, Hamamatsu Photonics K.K. (Japan)
Koei Yamamoto, Hamamatsu Photonics K.K. (Japan)

Published in SPIE Proceedings Vol. 10528:
Optical Components and Materials XV
Shibin Jiang; Michel J. F. Digonnet, Editor(s)

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