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Proceedings Paper

A portable non-contact displacement sensor and its application of lens centration error measurement
Author(s): Zong-Ru Yu; Wei-Jei Peng; Jung-Hsing Wang; Po-Jui Chen; Hua-Lin Chen; Yi-Hao Lin; Chun-Cheng Chen; Wei-Yao Hsu; Fong-Zhi Chen
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Paper Abstract

We present a portable non-contact displacement sensor (NCDS) based on astigmatic method for micron displacement measurement. The NCDS are composed of a collimated laser, a polarized beam splitter, a 1/4 wave plate, an aspheric objective lens, an astigmatic lens and a four-quadrant photodiode. A visible laser source is adopted for easier alignment and usage. The dimension of the sensor is limited to 115 mm x 36 mm x 56 mm, and a control box is used for dealing with signal and power control between the sensor and computer. The NCDS performs micron-accuracy with ±30 μm working range and the working distance is constrained in few millimeters. We also demonstrate the application of the NCDS for lens centration error measurement, which is similar to the total indicator runout (TIR) or edge thickness difference (ETD) of a lens measurement using contact dial indicator. This application has advantage for measuring lens made in soft materials that would be starched by using contact dial indicator.

Paper Details

Date Published: 22 February 2018
PDF: 7 pages
Proc. SPIE 10539, Photonic Instrumentation Engineering V, 1053917 (22 February 2018);
Show Author Affiliations
Zong-Ru Yu, Instrument Technology Research Ctr. (Taiwan)
Wei-Jei Peng, Instrument Technology Research Ctr. (Taiwan)
Jung-Hsing Wang, Instrument Technology Research Ctr. (Taiwan)
Po-Jui Chen, Instrument Technology Research Ctr. (Taiwan)
Hua-Lin Chen, Instrument Technology Research Ctr. (Taiwan)
Yi-Hao Lin, Instrument Technology Research Ctr. (Taiwan)
Chun-Cheng Chen, Instrument Technology Research Ctr. (Taiwan)
Wei-Yao Hsu, Instrument Technology Research Ctr. (Taiwan)
Fong-Zhi Chen, Instrument Technology Research Ctr. (Taiwan)

Published in SPIE Proceedings Vol. 10539:
Photonic Instrumentation Engineering V
Yakov G. Soskind, Editor(s)

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