Proceedings Paper
Nanophotonic particle simulation and inverse design using artificial neural networks| Format | Member Price | Non-Member Price |
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Paper Abstract
We propose a method to use artificial neural networks to approximate light scattering by multilayer nanoparticles. We find the network needs to be trained on only a small sampling of the data in order to approximate the simulation to high precision. Once the neural network is trained, it can simulate such optical processes orders of magnitude faster than conventional simulations. Furthermore, the trained neural network can be used solve nanophotonic inverse design problems by using back-propogation - where the gradient is analytical, not numerical.
Paper Details
Date Published: 23 February 2018
PDF: 6 pages
Proc. SPIE 10526, Physics and Simulation of Optoelectronic Devices XXVI, 1052607 (23 February 2018); doi: 10.1117/12.2289195
Published in SPIE Proceedings Vol. 10526:
Physics and Simulation of Optoelectronic Devices XXVI
Bernd Witzigmann; Marek Osiński; Yasuhiko Arakawa, Editor(s)
PDF: 6 pages
Proc. SPIE 10526, Physics and Simulation of Optoelectronic Devices XXVI, 1052607 (23 February 2018); doi: 10.1117/12.2289195
Show Author Affiliations
John Peurifoy, Massachusetts Institute of Technology (United States)
Yichen Shen, Massachusetts Institute of Technology (United States)
Li Jing, Massachusetts Institute of Technology (United States)
Yi Yang, Massachusetts Institute of Technology (United States)
Fidel Cano-Renteria, Massachusetts Institute of Technology (United States)
Yichen Shen, Massachusetts Institute of Technology (United States)
Li Jing, Massachusetts Institute of Technology (United States)
Yi Yang, Massachusetts Institute of Technology (United States)
Fidel Cano-Renteria, Massachusetts Institute of Technology (United States)
Brendan Delacy, U.S. Army Edgewood Chemical Biological Ctr. (United States)
Max Tegmark, Massachusetts Institute of Technology (United States)
John D. Joannopoulos, Massachusetts Institute of Technology (United States)
Marin Soljačić, Massachusetts Institute of Technology (United States)
Max Tegmark, Massachusetts Institute of Technology (United States)
John D. Joannopoulos, Massachusetts Institute of Technology (United States)
Marin Soljačić, Massachusetts Institute of Technology (United States)
Published in SPIE Proceedings Vol. 10526:
Physics and Simulation of Optoelectronic Devices XXVI
Bernd Witzigmann; Marek Osiński; Yasuhiko Arakawa, Editor(s)
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