Share Email Print
cover

Proceedings Paper

Multi-axis parallelism measuring system with temperature insensitivity
Author(s): Lei Zhang; Kai Zhang
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

In order to detect the parallelism of optical axis of photoelectric device accurately in large temperature difference environment, we design a measuring system based on Cassegrain structure. The system is adapt to the temperature range from −40° to +55° with the spectral bandwidth from 0.4μm to 12μm. According to the demand of temperature stability, the athermal structure of the system is analyzed and the compensation by different mechanical materials is carried out. The beam parallel deviation is less than 4" in different temperature. The experimental result shows that the system has good temperature stability.

Paper Details

Date Published: 12 January 2018
PDF: 8 pages
Proc. SPIE 10621, 2017 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 106210W (12 January 2018); doi: 10.1117/12.2288058
Show Author Affiliations
Lei Zhang, Changchun Univ. of Science and Technology (China)
Kai Zhang, Changchun Univ. of Science and Technology (China)


Published in SPIE Proceedings Vol. 10621:
2017 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
Jigui Zhu; Hwa-Yaw Tam; Kexin Xu; Hai Xiao; Liquan Dong, Editor(s)

© SPIE. Terms of Use
Back to Top
PREMIUM CONTENT
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?
close_icon_gray