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Proceedings Paper

Detection of microstructural defects in chalcopyrite Cu(In,Ga)Se2 solar cells by spectrally-filtered electroluminescence
Author(s): L. Skvarenina; A. Gajdos; R. Macku; P. Skarvada
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Paper Abstract

The aim of this research is to detect and localize microstructural defects by using an electrically excited light emission from a forward/reverse-bias stressed pn-junction in thin-film Cu(In; Ga)Se2 solar cells with metal wrap through architecture. A different origin of the local light emission from intrinsic/extrinsic imperfections in these chalcopyrite-based solar cells can be distinguished by a spectrally-filtered electroluminescence mapping. After a light emission mapping and localization of the defects in a macro scale is performed a micro scale exploration of the solar cell surface by a scanning electron microscope which follows the particular defects obtained by an electroluminescence. In particular, these macroscopic/microscopic examinations are performed independently, then the searching of the corresponding defects in the micro scale is rather difficult due to a diffused light emission obtained from the macro scale localization. Some of the defects accompanied by a highly intense light emission very often lead to a strong local overheating. Therefore, the lock-in infrared thermography is also performed along with an electroluminescence mapping.

Paper Details

Date Published: 1 December 2017
PDF: 7 pages
Proc. SPIE 10603, Photonics, Devices, and Systems VII, 1060317 (1 December 2017); doi: 10.1117/12.2286841
Show Author Affiliations
L. Skvarenina, Brno Univ. of Technology (Czech Republic)
A. Gajdos, Brno Univ. of Technology (Czech Republic)
R. Macku, Brno Univ. of Technology (Czech Republic)
P. Skarvada, Brno Univ. of Technology (Czech Republic)


Published in SPIE Proceedings Vol. 10603:
Photonics, Devices, and Systems VII
Karel Fliegel; Petr Páta, Editor(s)

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