Share Email Print

Proceedings Paper

Defect analysis and detection of micro nano structured optical thin film
Author(s): Chang Xu; Nuo Shi; Lang Zhou; Qinfeng Shi; Yang Yang; Zhuo Li
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

This paper focuses on developing an automated method for detecting defects on our wavelength conversion thin film. We analyzes the operating principle of our wavelength conversion Micro/Nano thin film which absorbing visible light and emitting infrared radiation, indicates the relationship between the pixel’s pattern and the radiation of the thin film, and issues the principle of defining blind pixels and their categories due to the calculated and experimental results. An effective method is issued for the automated detection based on wavelet transform and template matching. The results reveal that this method has desired accuracy and processing speed.

Paper Details

Date Published: 24 October 2017
PDF: 7 pages
Proc. SPIE 10460, AOPC 2017: Optoelectronics and Micro/Nano-Optics, 104601S (24 October 2017); doi: 10.1117/12.2285625
Show Author Affiliations
Chang Xu, Beijing Institute of Technology (China)
Zhejiang Business Technology Institute (China)
Nuo Shi, Beijing Institute of Technology (China)
Lang Zhou, Beijing Institute of Technology (China)
Qinfeng Shi, Beijing Institute of Technology (China)
Yang Yang, Beijing Institute of Technology (China)
Zhuo Li, Beijing Institute of Technology (China)

Published in SPIE Proceedings Vol. 10460:
AOPC 2017: Optoelectronics and Micro/Nano-Optics
Min Qiu; Min Gu; Xiaocong Yuan; Zhiping Zhou, Editor(s)

© SPIE. Terms of Use
Back to Top