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Proceedings Paper

Effect of nano-scale morphology on micro-channel wall surface and electrical characterization in lead silicate glass micro-channel plate
Author(s): Hua Cai; Fangjun Li; Yanglei Xu; Tiezhu Bo; Dongzhan Zhou; Jiao Lian; Qing Li; Zhenbo Cao; Tao Xu; Caili Wang; Hui Liu; Guoen Li; Jinsheng Jia
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Paper Abstract

Micro-channel plate (MCP) is a two dimensional arrays of microscopic channel charge particle multiplier. Silicate composition and hydrogen reduction are keys to determine surface morphology of micro-channel wall in MCP. In this paper, lead silicate glass micro-channel plates in two different cesium contents (0at%, 0.5at%) and two different hydrogen reduction temperatures (400°C,450°C) were present. The nano-scale morphology, elements content and chemical states of microporous wall surface treated under different alkaline compositions and reduction conditions was investigated by Atomic Force Microscopy (AFM) and X-ray Photoelectron Spectroscopy (XPS), respectively. Meanwhile, the electrical characterizations of MCP, including the bulk resistance, electron gain and the density of dark current, were measured in a Vacuum Photoelectron Imaging Test Facility (VPIT).The results indicated that the granular phase occurred on the surface of microporous wall and diffuses in bulk glass is an aggregate of Pb atom derived from the reduction of Pb2+. In micro-channel plate, the electron gain and bulk resistance were mainly correlated to particle size and distribution, the density of dark current (DDC) went up with the increasing root-mean-square roughness (RMS) on the microporous wall surface. Adding cesiums improved the size of Pb atomic aggregation, lowered the relative concentration of [Pb] reduced from Pb2+ and decreased the total roughness of micro-channel wall surface, leading a higher bulk resistance, a lower electron gain and a less dark current. Increasing hydrogen reduction temperature also improved the size of Pb atomic aggregation, but enhanced the relative concentration of [Pb] and enlarged the total roughness of micro-channel wall surface, leading a higher bulk resistance, a lower electron gain and a larger dark current. The reasons for the difference of electrical characteristics were discussed.

Paper Details

Date Published: 24 October 2017
PDF: 7 pages
Proc. SPIE 10460, AOPC 2017: Optoelectronics and Micro/Nano-Optics, 104601G (24 October 2017); doi: 10.1117/12.2285198
Show Author Affiliations
Hua Cai, China Building Materials Academy (China)
Fangjun Li, China Building Materials Academy (China)
Yanglei Xu, China Building Materials Academy (China)
Tiezhu Bo, China Building Materials Academy (China)
Dongzhan Zhou, China Building Materials Academy (China)
Jiao Lian, China Building Materials Academy (China)
Qing Li, China Building Materials Academy (China)
Zhenbo Cao, China Building Materials Academy (China)
Tao Xu, China Building Materials Academy (China)
Caili Wang, China Building Materials Academy (China)
Hui Liu, China Building Materials Academy (China)
Guoen Li, China Building Materials Academy (China)
Jinsheng Jia, China Building Materials Academy (China)

Published in SPIE Proceedings Vol. 10460:
AOPC 2017: Optoelectronics and Micro/Nano-Optics
Min Qiu; Min Gu; Xiaocong Yuan; Zhiping Zhou, Editor(s)

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