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Proceedings Paper

Stimulated emission and spontaneous loss pump-probe microscopy for background removal
Author(s): Subir Das; Bo-Wei Ho; Fu-Jen Kao
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Paper Abstract

In this work, we have established a double modulation lock-in detection technique using two semiconductor laser diodes in stimulated emission based pump-probe microscopy. By modulating the pump and probe beams at two different frequencies, f1 and f2, the signal is then recovered with the sum frequency, (f1+ f2), so as to minimize the leak-through noise due to the spontaneous emission caused by the pump beam. In this way, the DC background that is often attributed to the stimulated emission is effectively removed. Our technique has implemented in ATTO647N fluorescent dye which is applicable for many biological applications.

Paper Details

Date Published: 23 February 2018
PDF: 6 pages
Proc. SPIE 10498, Multiphoton Microscopy in the Biomedical Sciences XVIII, 104982C (23 February 2018);
Show Author Affiliations
Subir Das, National Yang-Ming Univ. (Taiwan)
Bo-Wei Ho, National Yang-Ming Univ. (Taiwan)
Fu-Jen Kao, National Yang-Ming Univ. (Taiwan)

Published in SPIE Proceedings Vol. 10498:
Multiphoton Microscopy in the Biomedical Sciences XVIII
Ammasi Periasamy; Peter T. C. So; Karsten König; Xiaoliang S. Xie, Editor(s)

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