
Proceedings Paper
Analysis of polarization-sensitive resonator based on vectorial eigenvector methodFormat | Member Price | Non-Member Price |
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Paper Abstract
Polarization selective devices are commonly utilized as rear mirrors to generate high power cylindrical vector (CV) beams in the resonators. The modes of these polarization sensitive resonators are very significant for the generation and application of CV beams. Upon the scalar eigenvector method, a vectorial eigenvector method (VEM) was used to compute the CV modes of polarization-selective resonators. Then, different polarization dependent resonators were simulated with the VEM. We can find that both mode TE01* and mode TEM00 are the eigen modes of polarization sensitive symmetric confocal sphere resonator and when Rte=0.99 and Rtm=0.93, TE01* most possibly appears in the cavity with polarization sensitivity due to its lowest loss. In addition, the VEM was used to guide our design of a 45-degree three-fold cavity structure for high power radially polarized laser. The axicon mirrors with azimuthal polarization selection and four λ/4 phase shifters are used to obtain the output of radially polarized light.
Paper Details
Date Published: 24 October 2017
PDF: 6 pages
Proc. SPIE 10457, AOPC 2017: Laser Components, Systems, and Applications, 104571D (24 October 2017); doi: 10.1117/12.2284247
Published in SPIE Proceedings Vol. 10457:
AOPC 2017: Laser Components, Systems, and Applications
Shibin Jiang; Lijun Wang; Lan Jiang; Long Zhang, Editor(s)
PDF: 6 pages
Proc. SPIE 10457, AOPC 2017: Laser Components, Systems, and Applications, 104571D (24 October 2017); doi: 10.1117/12.2284247
Show Author Affiliations
Youyou Hu, Huazhong Univ. of Science and Technology (China)
Xiahui Tang, Huazhong Univ. of Science and Technology (China)
Xiahui Tang, Huazhong Univ. of Science and Technology (China)
Bo Li, Huazhong Univ. of Science and Technology (China)
Published in SPIE Proceedings Vol. 10457:
AOPC 2017: Laser Components, Systems, and Applications
Shibin Jiang; Lijun Wang; Lan Jiang; Long Zhang, Editor(s)
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