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Proceedings Paper

Method for reducing the degradation effects of EMI wire grid on the optic performance
Author(s): Zhifeng Li; Zhenhong Niu; Jianhua Li; Qian Zhao; Xin Liu; Jiaqi Liu
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Paper Abstract

The mechanism of the image degradation due to the opaque metallic wire grid is analyzed and a degradation mode is built based on the theory of Fourier optics. The effect of different opaque wire grid on the image quality is simulated. We define the manner of using wire grid that will meet system requirements for both optical and shielding efficiency. A gray non-uniformity correction model based on two-point correction method is built, and the way to estimate the degradation function and the restoration process are proposed. Both the experimental results and simulation show that the non-uniformity of the image after correction is less than 1/10 of that of before correction and the relative error between the original image and restored image is 0.56%.

Paper Details

Date Published: 24 October 2017
PDF: 7 pages
Proc. SPIE 10462, AOPC 2017: Optical Sensing and Imaging Technology and Applications, 1046216 (24 October 2017); doi: 10.1117/12.2283274
Show Author Affiliations
Zhifeng Li, National Key Lab. of Science and Technology on Test Physics & Numerical Mathematics (China)
Zhenhong Niu, National Key Lab. of Science and Technology on Test Physics & Numerical Mathematics (China)
Jianhua Li, National Key Lab. of Science and Technology on Test Physics & Numerical Mathematics (China)
Qian Zhao, National Key Lab. of Science and Technology on Test Physics & Numerical Mathematics (China)
Xin Liu, National Key Lab. of Science and Technology on Test Physics and Numerical Mathematics (China)
Jiaqi Liu, National Key Lab. of Science and Technology on Test Physics & Numerical Mathematics (China)


Published in SPIE Proceedings Vol. 10462:
AOPC 2017: Optical Sensing and Imaging Technology and Applications
Yadong Jiang; Haimei Gong; Weibiao Chen; Jin Li, Editor(s)

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