Owing to the advantages of low loss, high spatial uniformity and high damage threshold, plasma electrode pockels cell (PEPC) is the key element of multi-pass amplifying technology in large laser facilities. Properties of PEPC is directly affected by the optical axis angle of the electro-optic crystal. Therefore, high precision measurement of the optical axis angle is indispensable. X-ray diffraction analysis method is a traditional way to determine the direction of optical axis of crystal, which is presented. By using conoscopic interference technique, a measurement system for optical axis angle of electro-optic crystal is introduced. The principle of conoscopic interference method is described in detail, and a series of techniques are implied in this measurement system to improve the accuracy. The optical axis angle two different electro-optic crystal is measured by X-ray diffraction analysis method and our conoscopic interference measurement system, respectively. The absolute error is less than 0.01mrad, while the relative error is nearly 2%.

Date Published: 24 October 2017
PDF: 4 pages
Proc. SPIE 10457, AOPC 2017: Laser Components, Systems, and Applications, 104570R (24 October 2017); doi: 10.1117/12.2283131

Published in SPIE Proceedings Vol. 10457:
AOPC 2017: Laser Components, Systems, and Applications
Shibin Jiang; Lijun Wang; Lan Jiang; Long Zhang, Editor(s)