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Proceedings Paper

Theoretical analysis of a spectrometric interferometer based on silicon-on insulator (SOI) waveguide layers
Author(s): Kazimierz Gut
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Paper Abstract

The paper presents an analysis of spectral interference in silicon-on-insulator (SIO) planar waveguide structures. The analysis was performed for the wavelength range of 1540nm-1560nm. The TE0 and TM0 orthogonal modes which propagate in this wavelength range are considered. At the output of the system, an interference signal behind a polarizer can be recorded. If a spectrometer is used as a detector, the recorded signal is a function of the wavelength. Change in the propagation conditions results in a change of the recorded signal shape.

Paper Details

Date Published: 1 September 2017
PDF: 6 pages
Proc. SPIE 10455, 12th Conference on Integrated Optics: Sensors, Sensing Structures, and Methods, 104550M (1 September 2017); doi: 10.1117/12.2282764
Show Author Affiliations
Kazimierz Gut, Silesian Univ. of Technology (Poland)

Published in SPIE Proceedings Vol. 10455:
12th Conference on Integrated Optics: Sensors, Sensing Structures, and Methods
Przemyslaw Struk; Tadeusz Pustelny, Editor(s)

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