Share Email Print

Proceedings Paper

A cascade method for TFT-LCD defect detection
Author(s): Songsong Yi; Xiaojun Wu; Zhiyang Yu; Zhuoya Mo
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

In this paper, we propose a novel cascade detection algorithm which focuses on point and line defects on TFT-LCD. At the first step of the algorithm, we use the gray level difference of su-bimage to segment the abnormal area. The second step is based on phase only transform (POT) which corresponds to the Discrete Fourier Transform (DFT), normalized by the magnitude. It can remove regularities like texture and noise. After that, we improve the method of setting regions of interest (ROI) with the method of edge segmentation and polar transformation. The algorithm has outstanding performance in both computation speed and accuracy. It can solve most of the defect detections including dark point, light point, dark line, etc.

Paper Details

Date Published: 21 July 2017
PDF: 6 pages
Proc. SPIE 10420, Ninth International Conference on Digital Image Processing (ICDIP 2017), 104200T (21 July 2017);
Show Author Affiliations
Songsong Yi, Harbin Institute of Technology (China)
Xiaojun Wu, Harbin Institute of Technology (China)
Shenzhen Key Lab. for Advanced Motion Control and Modern Automation Equipment (China)
Zhiyang Yu, Harbin Institute of Technology (China)
Zhuoya Mo, Guangdong Tianji Industrial Intelligent System Co. Ltd. (China)

Published in SPIE Proceedings Vol. 10420:
Ninth International Conference on Digital Image Processing (ICDIP 2017)
Charles M. Falco; Xudong Jiang, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?