Share Email Print

Proceedings Paper

Automatic inspection apparatus based on high-speed image analysis: a new characterization technique for particle flow analysis
Author(s): Chun-Fu Lin; Chun-Jen Weng; Chi-Hung Hwang; Chih-Yen Chen; Chi-Wen Hsieh
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

To better understand the mechanism of ejecting spray droplet and raindrop, a high-speed image analysis for droplet characterization technique was proposed in this study. In our design, three basic units containing a high-speed CCD camera, a light source, and automatic image acquisition and data processing unit, are integrated to assess the droplet motion. Next, a set of multistage image processing algorithms, the droplet detection and droplet tracking, were developed and conducted to analyze the droplet trajectories of the grabbed frames. By controlling a very short exposure time, the droplet size and velocity can be obtained to generate the droplet size distribution (DSD). To examine our proposed approaches, a commercially available spray nozzle and raindrop are used to evaluate the effectiveness. Meanwhile, the pair-matching rate is also involved to validate the recognition rate of the droplet tracking algorithm. Using this proposed framework, it can be used to provide valuable data to assess the spray droplet or the precipitation status by their droplet size to droplet velocity.

Paper Details

Date Published: 21 July 2017
PDF: 5 pages
Proc. SPIE 10420, Ninth International Conference on Digital Image Processing (ICDIP 2017), 104201Q (21 July 2017);
Show Author Affiliations
Chun-Fu Lin, National Applied Research Labs. (Taiwan)
Chun-Jen Weng, National Applied Research Labs. (Taiwan)
Chi-Hung Hwang, National Applied Research Labs. (Taiwan)
Chih-Yen Chen, National Applied Research Labs. (Taiwan)
Chi-Wen Hsieh, National Chiayi Univ. (Taiwan)

Published in SPIE Proceedings Vol. 10420:
Ninth International Conference on Digital Image Processing (ICDIP 2017)
Charles M. Falco; Xudong Jiang, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?