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Proceedings Paper

InAs/GaSb superlattice quality investigation
Author(s): Aleksandra Henig; Kacper Grodecki; Krzysztof Murawski; Krystian Michalczewski; Łukasz Kubiszyn; Djalal Benyahia; Bartłomiej Jankiewicz; Bogusław Budner; Piotr Martyniuk
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Paper Abstract

In this work we compare two InAs/GaSb superlattice samples grown in MBE VIGO/MUT laboratory on 2 inch (001) GaAs substrate, using MBE technique. Both samples have the same architecture, however their growth processes were conducted at different temperatures. For sample A the growth temperature was equal 668 K (395°C), for sample B 588 K (315°C). Photoluminescence measurements were performed at 30 K. For sample A there is no photoluminescence signal, while spectrum for sample B consists of two peaks: bandgap peak at 0.5 eV and deep state peak at 0.25 eV. X-ray diffraction (XRD) measurements indicate that sample A has better crystallographic quality than sample B. Raman spectra consists of low energy peaks (20-100 cm-1) which confirm the existence of superlattice for both samples [4]. Additionally, for sample A there are peaks related to Sb precipitates. It suggests that except the InAs/GaSb superlattice there is an additional Sb layer which may disturb band structure of superlattice and cause the disappearance of photoluminescence for sample A.

Paper Details

Date Published: 1 September 2017
PDF: 5 pages
Proc. SPIE 10455, 12th Conference on Integrated Optics: Sensors, Sensing Structures, and Methods, 104550F (1 September 2017); doi: 10.1117/12.2281774
Show Author Affiliations
Aleksandra Henig, Military Univ. of Technology (Poland)
Kacper Grodecki, Military Univ. of Technology (Poland)
Krzysztof Murawski, Military Univ. of Technology (Poland)
Krystian Michalczewski, Military Univ. of Technology (Poland)
Łukasz Kubiszyn, VIGO System S.A. (Poland)
Djalal Benyahia, Military Univ. of Technology (Poland)
Bartłomiej Jankiewicz, Military Univ. of Technology (Poland)
Bogusław Budner, Military Univ. of Technology (Poland)
Piotr Martyniuk, Military Univ. of Technology (Poland)


Published in SPIE Proceedings Vol. 10455:
12th Conference on Integrated Optics: Sensors, Sensing Structures, and Methods
Przemyslaw Struk; Tadeusz Pustelny, Editor(s)

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